Double side Probe Station (DPS series)

Features:

* Very compact structure design, to save precious space.
* Sample holding via vacuum or fixture
* Easy to use
* High precision probe arm for DC and HF testing.
* The main application is semiconductor, microelectronics, electrics, physics, materials, chemistry,
opto-electrics, Nano-technology, MEMS, bio-technology, aerospace…etc.
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Options:

1. Shielding Box – Light and EMI shielded

2. Anti-vibration Table

3. Thermal Chuck

4. Probe Card Holder– high measurement efficiency

5. Adapter – Connect with different instruments

6. Vacuum pump

7. Air compressor

8. Others

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